机译:SOI MOSFET和SRAM位单元中的0.18-
Department of Electrical Engineering, IIT Delhi, New Delhi, India;
Department of Electrical Engineering, IIT Delhi, New Delhi, India;
Department of Space, Semiconductor Laboratory, Chandigarh, India;
Department of Space, Semiconductor Laboratory, Chandigarh, India;
Department of Electrical Engineering, IIT Delhi, New Delhi, India;
Radiation effects; Silicon-on-insulator; Performance evaluation; Random access memory; Semiconductor process modeling; MOSFET; Silicon;
机译:基于
机译:20 k到100kS / s的子
机译:Sub-
机译:混合