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DC Characterization and Fast Small-Signal Parameter Extraction of Organic Thin Film Transistors With Different Geometries

机译:不同几何形状有机薄膜晶体管的直流表征和快速小信号参数提取

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摘要

Organic Devices offer low-cost manufacturing and better flexibility, sustainability and solution-processability than their Si-based MOS counterparts, which make them suitable for new applications where those characteristics are an advantage. However, organic device performance is still far from that provided by CMOS technology and many issues are still unclear. In this work, a performance comparison is made between Interdigitated and Corbino geometries of Organic Thin Film Transistors (OTFT), with different areas but fabricated with identical stack materials and techniques. To this end, I-V characteristics and C-V curves of the OTFTs were measured and a Common-Source circuit was proposed and implemented for extracting relevant electrical parameters of the devices, through a standard small signal analysis. The parameter extraction methodology in the frequency domain proposed allows rapid testing of the device/circuit performance of this technology, which for the first time is applied to organic devices. Results show that despite the large voltages, organic transistors exhibit similar channel dimension dependencies to MOS devices and can be also described by the same small signal model.
机译:有机器件提供低成本的制造和更好的灵活性,可持续性和解决方案 - 比其基于SI的MOS对应物,使它们适用于这些特征是优势的新应用。然而,有机设备性能仍然远离CMOS技术提供,许多问题仍然不清楚。在这项工作中,有机薄膜晶体管(OTFT)的互分配和Corbino几何形状之间的性能比较,具有不同的区域,但用相同的堆叠材料和技术制造。为此,测量OTFT的I-V特性和C-V曲线,并提出了通过标准的小信号分析来提取器件的相关电气参数来提取和实施。建议频域中的参数提取方法允许快速测试该技术的装置/电路性能,这是第一次应用于有机设备。结果表明,尽管具有大的电压,有机晶体管表现出与MOS装置类似的通道尺寸依赖性,并且还可以通过相同的小信号模型描述。

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