Study of annealing effects on the physical properties of evaporated SnS thin films for photovoltaic applications

摘要

Tin Sulphide (SnS) thin films have been deposited on glass slides by thermal evaporation using SnS powder. The improvements in the structural and optical properties of SnS thin films on annealing at different temperatures (200°C, 300°C, 400°C, and 500°C) in vacuum for one hour are presented in this work. The thin films annealed at 500°C w ere decomposed, which limits the annealing temperature belo w than 500°C. X-ray diffraction characterization showed an intensive peak at 31.8° originating from (111) reflection. Ellipsometry measurements were done for optical studies and optical absorption coefficient for as-deposited films was 2.02 x10 4 increased to 4.90 x10 4 (cm) -1 for films annealed to 300°C for incident photon energies 1.55eV, and direct band gap of 1.90 eV was indicated.