首页> 外文期刊>Journal of Laser Micro/Nanoengineering >Deposition of Thin Films Composed of Fe81B13.5 Si3.5Co2 Material by PLD Method Using the ArF Excimer Laser
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Deposition of Thin Films Composed of Fe81B13.5 Si3.5Co2 Material by PLD Method Using the ArF Excimer Laser

机译:用ArF准分子激光PLD法沉积由Fe81B13.5 Si3.5Co2材料组成的薄膜

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Depositions of thin films, composed of Fe81B13.5 Si3.5Co2 material were performed with ArF excimer laser (λ = 193 nm). The material, with expected large magnetoelastic coefficient is potentially applicable in sensor and actuator technology. Depositions were done on polished orientation Si substrates held at different temperatures: RT, 250C, 450C and 550C. Results of AFM, MFM, SEM, EDS and FTIR measurements of the layers as a function of process parameters, in particular of the substrate temperature, are presented.
机译:用ArF准分子激光(λ= 193 nm)沉积由Fe81B13.5 Si3.5Co2材料组成的薄膜。具有预期大的磁弹性系数的材料可能适用于传感器和执行器技术。在保持在不同温度:RT,250C,450C和550C的抛光取向Si衬底上进行沉积。给出了各层的AFM,MFM,SEM,EDS和FTIR测量结果,这些结果取决于工艺参数,尤其是基板温度。

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