首页> 外文期刊>IEEE Transactions on Computers >An Effective DRAM Address Remapping for Mitigating Rowhammer Errors
【24h】

An Effective DRAM Address Remapping for Mitigating Rowhammer Errors

机译:有效的DRAM地址重新映射以减轻Rowhammer错误

获取原文
获取原文并翻译 | 示例

摘要

A rowhammer error represents a loss of data stored in a DRAM cell caused by electromagnetic interference due to repetitive access to the same and/or adjacent rows. Due to the concentrated occurrence of rowhammer errors in specific rows and columns, these errors cannot be corrected by the conventional error correcting code (ECC) commonly used in DRAM devices. Previous techniques avoid these errors by having additional refresh operations that require additional hardware resources and/or power consumption. This paper proposes a different approach to handle rowhammer errors by distributing them across different DRAM rows and columns so that the attack cells are not concentrated on specific rows and columns. To this end, the distribution of rowhammer errors is observed with experiments using several commercial DRAM devices by employing state-of-the-art rowhammer attack techniques. The observation of the rowhammer errors concentrated in specific rows and columns underlies the proposal of an effective DRAM address remapping scheme for re-distribution of rowhammer errors. By using different address mappings to different chips and arrays in a DIMM, the proposed remapping effectively distributes errors over different rows and columns. As a result, the proposed remapping scheme decreases the possibility of multiple errors in a single word, and consequently, reduces uncorrectable errors under single error or single symbol correcting ECC. Experimental results with commercial DIMMs show that the proposed scheme reduces uncorrectable errors by about 95 percent while incurring a small additional hardware cost.
机译:行锤错误表示由于重复访问相同和/或相邻行而引起的电磁干扰,导致DRAM单元中存储的数据丢失。由于在特定的行和列中会集中出现行锤错误,因此这些错误无法通过DRAM设备中常用的常规纠错码(ECC)进行纠正。先前的技术通过具有需要额外硬件资源和/或功耗的额外刷新操作来避免这些错误。本文提出了一种不同的方法来处理行锤错误,方法是将行错误分布在不同的DRAM行和列中,以使攻击单元不会集中在特定的行和列上。为此,通过使用最新的行锤攻击技术,使用几种商用DRAM设备进行的实验观察到了行锤错误的分布。对行锤错误的观察集中在特定的行和列中,这为重新分配行锤错误提供了有效的DRAM地址重映射方案的建议。通过对DIMM中的不同芯片和阵列使用不同的地址映射,建议的重新映射可将错误有效地分布在不同的行和列上。结果,所提出的重新映射方案减少了单个单词中出现多个错误的可能性,因此,减少了在单个错误或单个符号校正ECC下的不可校正错误。商业DIMM的实验结果表明,所提出的方案将不可纠正的错误减少了大约95%,同时又产生了少量的额外硬件成本。

著录项

  • 来源
    《IEEE Transactions on Computers》 |2019年第10期|1428-1441|共14页
  • 作者单位

    Seoul Natl Univ, Dept Elect & Comp Engn, Interuniv Semicond Res Ctr, Seoul 08826, South Korea;

    Seoul Natl Univ, Dept Elect & Comp Engn, Interuniv Semicond Res Ctr, Seoul 08826, South Korea;

    Seoul Natl Univ Sci & Technol, Res Ctr Elect & Informat Technol, Dept Elect & Informat Engn, Seoul 01811, South Korea;

    Seoul Natl Univ, Dept Elect & Comp Engn, Interuniv Semicond Res Ctr, Seoul 08826, South Korea;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    DRAM; rowhammer error; fault tolerance; reliability;

    机译:DRAM;ROWHAMMER错误;容错;可靠性;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号