首页> 外文期刊>Computer Methods in Applied Mechanics and Engineering >Analysis of thin piezoelectric solids by the boundary element method
【24h】

Analysis of thin piezoelectric solids by the boundary element method

机译:边界元法分析压电薄固体

获取原文
获取原文并翻译 | 示例

摘要

The piezoelectric boundary integral equation (BIE) formulation is applied to analyze thin piezoelectric solids, such as thin piezoelectric films and coatings, using the boundary element method (BEM). The nearly singular integrals existing in the piezoelectric BIE as applied to thin piezoelectric solids are addressed for the 2-D case. An efficient analytical method to deal with the nearly singular integrals in the piezoelectric BIE is developed to accurately compute these integrals in the piezoelectric BEM, no matter how close the source point is to the element of integration.
机译:压电边界积分方程(BIE)公式用于使用边界元方法(BEM)分析薄压电固体,例如压电薄膜和涂层。对于二维情况,解决了应用于薄压电固体的压电BIE中几乎存在的奇异积分。开发了一种有效的分析方法来处理压电BIE中几乎奇异的积分,从而无论源点离积分元素有多近,都可以准确地计算压电BEM中的这些积分。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号