首页> 外文期刊>IEEE transactions on circuits and systems. II, Express briefs >Realizing Unequal Error Correction for nand Flash Memory at Minimal Read Latency Overhead
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Realizing Unequal Error Correction for nand Flash Memory at Minimal Read Latency Overhead

机译:以最小的读取延迟开销实现nand闪存的不均等纠错

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In nand Flash memory, all pages have the same storage capacity and hence accommodate the same amount of redundancy in support of error correction. In current practice, user data in all the pages are protected by the same error correction code. However, different types of pages in multibit per cell memory have largely different bit error rates, for which appropriate unequal error correction can achieve a better utilization of memory redundancy and hence improve program/erase (P/E) cycling endurance. Nevertheless, a straightforward realization of unequal error correction suffers from severe memory read latency penalty. This brief presents a design strategy to implement unequal error correction through concatenated coding, which can well match the unequal error rates among different types of pages at minimal memory read latency penalty. Based on measurement results from commercial sub-22-nm 2 bits/cell nand Flash memory chips, we carried out simulations from both the coding and storage system perspectives, and the results show that this design strategy can improve the P/E cycling endurance by 20% and only incur less than 7% increase of storage system read response time at the end of Flash memory lifetime with the P/E cycling of around 1800.
机译:在nand闪存中,所有页面具有相同的存储容量,因此可容纳相同数量的冗余以支持错误纠正。在当前实践中,所有页面中的用户数据都由相同的纠错码保护。但是,每单元多位内存中不同类型的页面具有很大的误码率,为此,适当的不均等纠错可以更好地利用内存冗余,从而提高编程/擦除(P / E)循环寿命。然而,不均等的纠错的直接实现遭受严重的存储器读取等待时间损失。本简介提出了一种通过级联编码实现不均等错误纠正的设计策略,该策略可以很好地匹配不同类型页面之间的不均等错误率,并且以最小的内存读取延迟代价。根据商用22纳米以下2纳米2位/单元n和闪存芯片的测量结果,我们从编码和存储系统的角度进行了仿真,结果表明,该设计策略可以通过以下方式提高P / E循环寿命:在P / E循环约为1800的情况下,闪存寿命结束时,存储系统读取响应时间将增加20%,而仅导致存储系统读取响应时间增加不到7%。

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