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A Quadrature Sub-Sampling Phase Detector for Fast-Relocked Sub-Sampling PLL Under External Interference

机译:用于外部干扰下的快速重新锁定子采样PLL的正交子采样相位检测器

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摘要

Conventional sub-sampling PLLs suffer from unstable problems under external interference due to potential long relock time in some cases. To solve this issue, a novel quadrature sub-sampling phase detector (QSSPD) is proposed in this brief to eliminate phase error ambiguity and compensate gain non-linearity. Hence, relock time under external interference is dramatically reduced while maintaining the low in-band noise characteristics simultaneously. Moreover, a study on the dynamics of sub-sampling PLL is carried out based on dynamic equations of the sub-sampling loop. A 2.3-2.5 GHz integer-N SSPLL has been prototyped in a 65nm CMOS process to show the superiority of the proposed QSSPD, which reduces the relock time from 16.3 mu s to 4.8 mu s and even 1.1 mu s compared to conventional SSPD while suffering 5.4MHz frequency interference.
机译:由于在某些情况下,传统的子采样PLL由于潜在的长rescock时间而受到外部干扰的不稳定问题。为了解决这个问题,在本简要介绍中提出了一种新的正交子采样阶段检测器(QSSPD)以消除相位误差模糊,并补偿增益非线性。因此,在同时保持低带噪声特性的同时显着减小外部干扰下的REROCK时间。此外,基于子采样环的动态方程来执行对子采样PLL动态的研究。 2.3-2.5 GHz Integer-N SSPLL已在65nm CMOS过程中进行原型设计,以显示所提出的QSSPD的优越性,这与传统SSPD相比,从16.3亩S至4.8 mu S甚至1.1亩的RELOCK时间降低了5.4MHz频率干扰。

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