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Computational modeling of electrolytic deposition of a single-layer silicon film on silver and graphite substrates

机译:单层硅膜对银和石墨衬底电解沉积的计算模拟

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摘要

Electrodeposition of silicon from a KF-KCl-KI salt melt at 1000 K using silver and graphite substrates has been studied by the molecular dynamics method. Silicon films of monatomic thickness with a predominantly hexagonal honeycomb structure were obtained on each substrate. The adhesion energy between the obtained film and the silver substrate is 2.5 times higher than that between the film and the graphite substrate. A single cluster grows much faster on a graphite substrate than on a silver substrate, where several clusters are formed at once. As the substrates are filled with silicon, the diffusion coefficient of Si atoms decreases faster on a graphite substrate than on a silver one. The silver substrate is completely covered with silicon, while a three-dimensional Si cluster begins to grow on a graphite substrate incompletely filled with silicon. The obtained silicon films on both substrates do not have the characteristic buckling, which is found in silicene prepared by the chemical vapor deposition on a silver substrate. Films obtained on both substrates have low mechanical stress. The stress distribution in the case of a graphite substrate is more uniform.
机译:通过分子动力学方法研究了使用银和石墨衬底的1000 k的硅电沉积。在每个基底上获得具有主要六边形蜂窝结构的单体厚度的硅膜。所得薄膜和银基材之间的粘合能量比薄膜和石墨基底之间的粘合能量高2.5倍。单个簇在石墨衬底上比在银基质上的增长得多,其中一次形成几个簇。当基板填充有硅时,Si原子的扩散系数在石墨基底上的速度比在银衬底上更快地降低。银基材完全覆盖有硅,而三维Si簇开始在不完全填充硅的石墨衬底上生长。在两个基板上的所得硅膜没有特征屈曲,其在通过化学气相沉积在银基质上制备的硅硅中发现。在两个基板上获得的薄膜具有低机械应力。石墨衬底的情况下的应力分布更均匀。

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  • 来源
    《Applied Surface Science》 |2021年第30期|149959.1-149959.14|共14页
  • 作者单位

    Institute of High-Temperature Electrochemistry Ural Branch Russian Academy of Sciences Academic Str. 20 Yekaterinburg 620990 Russia|Ural Federal University named after the first President of Russia B.N. Yeltsin Mira Str. 19 Yekaterinburg 620002 Russia;

    Institute of High-Temperature Electrochemistry Ural Branch Russian Academy of Sciences Academic Str. 20 Yekaterinburg 620990 Russia|Ural Federal University named after the first President of Russia B.N. Yeltsin Mira Str. 19 Yekaterinburg 620002 Russia;

    Institute of High-Temperature Electrochemistry Ural Branch Russian Academy of Sciences Academic Str. 20 Yekaterinburg 620990 Russia;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Molecular dynamics; Molten salts; Silicon films; Substrate; Surface diffusion;

    机译:分子动力学;熔融盐;硅膜;基板;表面扩散;

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