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Enhanced hardness of nanocarbon films deposited on cemented tungsten carbide substrates by coaxial arc plasma deposition owing to employing silicon-doped graphite targets

机译:由于采用了掺硅的石墨靶,通过同轴电弧等离子体沉积提高了硬质碳化钨基体上沉积的纳米碳膜的硬度

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摘要

1 at% Si-doped nanocrystalline diamond/amorphous carbon (NCD/a-C) composite films were deposited on cemented carbide (WC-Co) substrates by coaxial arc plasma deposition. The doping of Si evidently degraded the hardness of films directly deposited on the substrates due to catalytic effects of diffused Co atoms into the films. On the other hand, by employing undoped NCD/a-C buffer layers, the Co diffusion was suppressed and the hardness was enhanced from 42 to 60 GPa. It was found that the Si doping enhances the formation of C-C sp(3) bonds, which resulted in the hardness enhancement in the case of suppressing the Co diffusion by insertion of undoped NCD/a-C buffer layers. (C) 2019 The Japan Society of Applied Physics
机译:通过同轴电弧等离子体沉积在硬质合金(WC-Co)基底上沉积1 at%的Si掺杂纳米晶金刚石/非晶碳(NCD / a-C)复合膜。 Si的掺杂由于扩散的Co原子进入膜中的催化作用而明显降低了直接沉积在基底上的膜的硬度。另一方面,通过使用未掺杂的NCD / a-C缓冲层,抑制了Co扩散,并且将硬度从42GPa提高到60GPa。发现Si掺杂增强了C-C sp(3)键的形成,这在通过插入未掺杂的NCD / a-C缓冲层而抑制Co扩散的情况下导致了硬度的提高。 (C)2019日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2019年第7期|075507.1-075507.6|共6页
  • 作者单位

    Kyushu Univ, Dept Appl Sci Elect & Mat, Kasuga, Fukuoka 8168580, Japan|Kafrelsheikh Univ, Dept Mech Engn, Kafrelsheikh 33516, Egypt;

    Kyushu Univ, Dept Appl Sci Elect & Mat, Kasuga, Fukuoka 8168580, Japan|OSG Corp, 2-17 Shirakumo Cho, Toyokawa, Aichi 4420018, Japan;

    Kyushu Univ, Dept Appl Sci Elect & Mat, Kasuga, Fukuoka 8168580, Japan|Al Azhar Univ, Dept Phys, Cairo 11884, Egypt;

    OSG Corp, 2-17 Shirakumo Cho, Toyokawa, Aichi 4420018, Japan;

    OSG Corp, 2-17 Shirakumo Cho, Toyokawa, Aichi 4420018, Japan;

    OSG Corp, 2-17 Shirakumo Cho, Toyokawa, Aichi 4420018, Japan;

    Kyushu Univ, Dept Appl Sci Elect & Mat, Kasuga, Fukuoka 8168580, Japan;

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