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Enhanced hardness of nanocarbon films deposited on cemented tungsten carbide substrates by coaxial arc plasma deposition owing to employing silicon-doped graphite targets

机译:由于采用掺杂硅掺杂石墨靶,通过同轴弧等离子体沉积增强纳米碳膜膜的硬度通过同轴弧等离子体沉积

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摘要

1 at% Si-doped nanocrystalline diamond/amorphous carbon (NCD/a-C) composite films were deposited on cemented carbide (WC-Co) substrates by coaxial arc plasma deposition. The doping of Si evidently degraded the hardness of films directly deposited on the substrates due to catalytic effects of diffused Co atoms into the films. On the other hand, by employing undoped NCD/a-C buffer layers, the Co diffusion was suppressed and the hardness was enhanced from 42 to 60 GPa. It was found that the Si doping enhances the formation of C-C sp(3) bonds, which resulted in the hardness enhancement in the case of suppressing the Co diffusion by insertion of undoped NCD/a-C buffer layers. (C) 2019 The Japan Society of Applied Physics
机译:通过同轴弧等离子体沉积将1%的Si掺杂的纳米晶金刚石/无定形碳(NCD / A-C)复合膜沉积在硬质合金(WC-CO)底物上。由于扩散的CO原子进入薄膜,Si的掺杂明显降低了直接沉积在基材上的膜的硬度。另一方面,通过使用未掺杂的NCD / A-C缓冲层,抑制了CO扩散,并且硬度从42-60GPa增强。发现Si掺杂增强了C-C SP(3)键的形成,这导致通过插入未掺杂的NCD / A-C缓冲层抑制CO扩散的情况下的硬度增强。 (c)2019年日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2019年第7期|075507.1-075507.6|共6页
  • 作者单位

    Kyushu Univ Dept Appl Sci Elect & Mat Kasuga Fukuoka 8168580 Japan|Kafrelsheikh Univ Dept Mech Engn Kafrelsheikh 33516 Egypt;

    Kyushu Univ Dept Appl Sci Elect & Mat Kasuga Fukuoka 8168580 Japan|OSG Corp 2-17 Shirakumo Cho Toyokawa Aichi 4420018 Japan;

    Kyushu Univ Dept Appl Sci Elect & Mat Kasuga Fukuoka 8168580 Japan|Al Azhar Univ Dept Phys Cairo 11884 Egypt;

    OSG Corp 2-17 Shirakumo Cho Toyokawa Aichi 4420018 Japan;

    OSG Corp 2-17 Shirakumo Cho Toyokawa Aichi 4420018 Japan;

    OSG Corp 2-17 Shirakumo Cho Toyokawa Aichi 4420018 Japan;

    Kyushu Univ Dept Appl Sci Elect & Mat Kasuga Fukuoka 8168580 Japan;

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