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Extracting the model parameters of high-Tc superconductor film from the experimental characteristics of microwave resonators and filters

机译:从微波谐振腔和滤波器的实验特性中提取高Tc超导薄膜的模型参数

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摘要

A development of CAD of microwave integrated circuits based on high-Tc superconducting (HTS) films is of high importance. Design of planar HTS microwave devices (filters, multiplexers etc.) is based on a careful simulation of the device characteristics and requires a correct model description of the HTS material. A method of extracting model parameters of HTS film from the experimental characteristics of microwave resonators and filters is considered. It is based on a correct phenomenological model of the HTS film surface impedance and accurate simulation of the microwave resonator (filter). The calculation of the model parameters was realized by Monte Carlo method based on properties of the quasirandom (Halton's) sequences. The set of extracted model parameters is used in the CAD tool for HTS microwave circuits design providing a good agreement between simulated and measured data. A procedure of extracting model parameters of a ferroelectric film from the experimental characteristics is also proposed.
机译:基于高Tc超导(HTS)膜的微波集成电路CAD的开发非常重要。平面HTS微波设备(滤波器,多路复用器等)的设计基于对设备特性的仔细模拟,并且需要对HTS材料进行正确的模型描述。考虑了一种从微波谐振腔和滤波器的实验特性中提取高温超导薄膜模型参数的方法。它基于HTS薄膜表面阻抗的正确现象模型和微波谐振器(滤波器)的精确仿真。基于准随机(哈尔顿)序列的属性,通过蒙特卡洛方法实现了模型参数的计算。提取的模型参数集在HTS微波电路设计的CAD工具中使用,从而在仿真数据和测量数据之间取得了良好的一致性。还提出了一种从实验特性中提取铁电薄膜模型参数的方法。

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