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Thermal management of a 3D packaging structure for superconducting quantum annealing machines

机译:超导量子退火机器3D包装结构的热管理

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摘要

Quantum annealing (QA) is a computing paradigm for solving combinatorial optimization problems by finding the low-energy configurations of complicated Ising models through quantum fluctuation. Recently, because of the strictly limited number of superconducting qubits per chip, three-dimensional (3D) integrated technologies have attracted great attention for realizing a practical large-scale QA machine. Because a cryogenic environment is required for qubit chip operation, the less-effective heat transfer in the stacked structure has become a major concern. In the present paper, a method to realize a sufficiently low temperature for quantum operation in large-scale superconducting QA machines based on 3D packaging technology is proposed and demonstrated numerically. We reveal that the heating in such a 3D structure, which seriously reduces the quantum coherence of qubit chips, is effectively prevented by adding through-silicon vias (TSVs). Accordingly, the temperature of the qubit chip is drastically reduced from 57.8 mK to 16.4 mK. Our results indicate that using TSVs are a powerful and simple approach to realizing practical large-scale superconducting QA machines.
机译:Quantum退火(QA)是通过量子波动找到复杂ising模型的低能量配置来解决组合优化问题的计算范例。最近,由于每个芯片的超导Qubits数量严格有限,三维(3D)综合技术引起了实现实用大型QA机器的极大关注。由于Qubit芯片操作所需的低温环境,所以堆叠结构的较少有效的传热已成为主要问题。在本文中,提出了一种在基于3D包装技术的大型超导QA机器中实现足够低的量子操作的方法,并在数值上进行了说明。我们揭示了通过加入硅通孔(TSV)来实际降低Qubit芯片量子相干量的这种3D结构中的加热。因此,Qubit芯片的温度从57.8 mk到16.4 mk大大降低。我们的结果表明,使用TSV是一种强大而简单的方法,可以实现实用的大型超导QA机器。

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  • 来源
    《Applied Physics Letters》 |2021年第17期|174004.1-174004.6|共6页
  • 作者单位

    Device Technology Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki 305-8560 Japan;

    Device Technology Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki 305-8560 Japan;

    Device Technology Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki 305-8560 Japan;

    Device Technology Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki 305-8560 Japan;

    Device Technology Research Institute National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki 305-8560 Japan;

    Research Center for Emerging Computing Technology (RCECT) National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki 305-8568 Japan;

    Research Center for Emerging Computing Technology (RCECT) National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Ibaraki 305-8568 Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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