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Hysteresis mechanism in pentacene thin-film transistors with poly(4-vinyl phenol) gate insulator

机译:具有聚(4-乙烯基苯酚)栅绝缘体的并五苯薄膜晶体管的磁滞机理

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摘要

The hysteresis mechanism is studied in pentacene organic thin-film transistors (OTFTs) with poly(4-vinyl phenol) (PVP) gate insulator by examining OTFTs with an oxide/PVP double layer gate insulator. The oxide thickness affects the direction of the hysteresis as well as its magnitude. This result can be explained on the basis of the charge injection and trapping mechanism rather than slow polarization or ion migration. The hysteresis occurs mainly due to the charges which could be injected from the gate electrode and trapped in the PVP. As the thickness of the oxide layer is increased, the gate charge injection is blocked and the effect of the charges from the channel increases.
机译:通过研究带有氧化物/ PVP双层栅极绝缘体的OTFT,研究了具有聚(4-乙烯基苯酚)(PVP)栅极绝缘体的并五苯有机薄膜晶体管(OTFT)的磁滞机理。氧化物的厚度会影响磁滞的方向及其大小。该结果可以基于电荷注入和俘获机制而不是缓慢的极化或离子迁移来解释。滞后现象的发生主要是由于电荷可能从栅电极注入并捕获在PVP中。随着氧化物层的厚度增加,栅极电荷注入被阻挡,并且来自沟道的电荷的影响增加。

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