机译:光子诱导的随机电报信号由于在纳米级Si p-n结中单个供体-受体对的势能波动。
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;
School of Materials Science, Japan Advanced Institute of Science and Technology, Nomi, Ishikawa 923-1211, Japan,Nano Group, ECS, Faculty of Physical and Applied Sciences, University of Southampton, Southampton S017 1BJ, U.K.;
Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan;
机译:GeSi纳米岛在硅p-n结隧穿中的随机电报信号
机译:前向单壁碳纳米管薄膜-硅肖特基结中的随机电报信号和1 / f噪声
机译:前向单壁碳纳米管薄膜-硅肖特基结中的随机电报信号和1 / f噪声
机译:纳米晶体管中的单一选择陷阱; RTS(随机电报信号)和l / f噪声
机译:使用随机电报信号进行半导体/栅极介电缺陷的测量,建模和仿真。
机译:纳米级晶体管中的异常随机电报噪声作为氧化物陷阱的两个亚稳态的直接证据
机译:二维多隧道结阵列中的单光子诱发的随机电报信号
机译:al(x)Ga(1-x)as-Gaas量子阱异质结构中沿p-n结的光子诱导各向异性氧化。 (重新公布新的可用性信息)