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Minimization of MEMS Breakdowns Effects on the Radiation of a MEMS Based Reconfigurable Reflectarray

机译:最小化MEMS故障对基于MEMS的可重构Reflectarray辐射的影响

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We present an investigation of MEMS breakdowns effects on the radiation pattern of a MEMS based reconfigurable reflectarray. In addition, a correction procedure is proposed to minimize phase errors due to breakdowns. It takes advantage of the numerous possibilities offered by the refectarray's cell to achieve a given phase shift. Furthermore, a systematic methodology is proposed to assess cell's robustness to breakdowns by defining a cumulative root mean square error accounting for any possible MEMS failure. It is shown to provide a convenient means of comparing different possible cell topologies. Finally, it is also used to minimize the number of MEMS in the cell while preserving the necessary redundancy to limit phase errors.
机译:我们目前对基于MEMS的可重构反射阵列的MEMS击穿对辐射方向图的影响进行研究。另外,提出了一种校正程序以使由于故障引起的相位误差最小。它利用了refectarray单元提供的众多可能性来实现给定的相移。此外,提出了一种系统方法,通过定义累积的均方根误差来评估电池对击穿的鲁棒性,以解决任何可能的MEMS故障。示出了提供比较不同可能的小区拓扑的便利手段。最后,它还用于最小化单元中的MEMS数量,同时保留必要的冗余度以限制相位误差。

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