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A 4 × 128 SPAD array with a 78-ps 512-channel TDC for time-gated pulsed Raman spectroscopy

机译:4×128 SPAD阵列,具有78ps 512通道TDC,用于时间门控脉冲拉曼光谱

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A time-gated 4 × 128 single photon avalanche diode (SPAD) line array with a 512-channel time-to-digital converter (TDC) has been designed and fabricated in a 0.35 µm high voltage CMOS technology for pulsed Raman spectroscopy. In Raman spectroscopy the SPAD array can be designed as a line array with a high fill factor because the electronics can be placed on either side of it. The resolution of the designed TDC is 80 ps in the first four bins, to achieve an accurate time position of the Raman photons, while the last four bins are increased in width to achieve a larger dynamic range. The measured standard deviation of the variation in the width of the first four bins of the 512-channel TDC was less than 10 ps. In addition, cross-talk measurements were carried out to investigate the probability of cross-talk between adjacent SPADs in an array of high density. These showed a cross-talk probability of 0.12 % with a pitch of 32 µm between adjacent SPADs. The highest probability of cross-talk was found to occur with a short delay.
机译:设计和制造了带有512通道时间数字转换器(TDC)的时间门控4×128单光子雪崩二极管(SPAD)线阵列,并采用0.35μm高压CMOS技术制造了该器件,用于脉冲拉曼光谱分析。在拉曼光谱中,SPAD阵列可以设计为具有高填充因子的线阵列,因为电子器件可以放置在其任一侧。设计的TDC的分辨率在前四个仓中为80ps,以实现拉曼光子的准确时间位置,而后四个仓的宽度增加以实现更大的动态范围。 512通道TDC的前四个仓的宽度变化的测量标准偏差小于10ps。另外,进行了串扰测量以研究高密度阵列中相邻SPAD之间串扰的可能性。这些显示出串扰概率为0.12%,相邻的SPAD之间的间距为32μm。发现串扰的最高可能性是在短时间内发生的。

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