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A $2times (4)times 128$ Multitime-Gated SPAD Line Detector for Pulsed Raman Spectroscopy

机译: $ 2乘以(4)乘以128 $ 用于脉冲拉曼光谱的多时门SPAD线检测器

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A time-gated single photon avalanche diode line detector for pulsed laser Raman spectroscopy has been developed and fabricated in a 0.35-m high-voltage CMOS technology. The sample is illuminated with short laser pulses ( ps) at a rate of kHz and four time gates synchronized with these pulses and having selectable widths within the subnanoseconds range are used to measure the Raman photons and fluorescence background simultaneously. The fluorescence background measurement is used to suppress the residual fluorescence level to improve the quality of the Raman spectrum. The variation in the width of the time window was measured to be approximately ±17.5 ps along the spectral axis when set externally to a nominal value of 100 ps. Measurements with a reference sample demonstrate the effect of nonhomogeneities in the time gates on the quality of the recorded Raman spectrum and the residual fluorescence correction.
机译:一种用于脉冲激光拉曼光谱的时控单光子雪崩二极管线检测器已经开发出来,并以0.35-m高压CMOS技术制造。用短激光脉冲(ps)以kHz的速率照射样品,并使用与这些脉冲同步且具有亚纳秒范围内的可选宽度的四个时间门同时测量拉曼光子和荧光背景。荧光背景测量用于抑制残留荧光水平,以提高拉曼光谱的质量。当从外部设置为100 ps的标称值时,沿光谱轴测得的时间窗口宽度的变化约为±17.5 ps。用参考样品进行的测量证明了时间门的不均匀性对记录的拉曼光谱和残留荧光校正的质量的影响。

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