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Manufacturability Study of LTCC Integrated Packages for High Performance, Low Cost RF SiP Modules

机译:用于高性能,低成本RF SiP模块的LTCC集成封装的可制造性研究

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This paper presents an extensive study conducted on a variety of commercially available LTCC material system The purpose of the study was to evaluate the comparative quality of LTCC substrates with embedded RF components, for a System-in-Package (SiP) module. The module has a flip chip IC and EGA contacts, and is designed as a highly integrated receiver for the radio section of a CDMA mobile phone handset. In Part 1 of this study, measurements of defect rates and the variation in both physical and electrical (DC and RF) performance characteristics were collected and compared on samples produced by several (up to 7) different commercial LTCC foundries. Statistically significant sample sizes of specially designed PCM (Process Control Monitor) test structures were tested and analyzed. Part 2 of the study used a custom SEC (Standard Evaluation Circuit) module substrate designed and fabricated in LTCC. The samples were processed through a high volume SiP assembly line to evaluate the compatibility of each type of LTCC with flip chip and EGA processes in a true manufacturing environment. During Part 3 of the study, statistics were collected on the reproducibility of the embedded components produced by a single LTCC supplier across multiple manufacturing lots. Each part of the study revealed significant differences between LTCC material systems, both in the level of process control when fabricating embedded passive structures, and in their compatibility with standard assembly processes.
机译:本文提出了对各种市售LTCC材料系统进行的广泛研究。该研究的目的是评估用于系统级封装(SiP)模块的具有嵌入式RF组件的LTCC基板的比较质量。该模块具有倒装芯片IC和EGA触点,并被设计为CDMA移动电话的无线电部分的高度集成接收器。在本研究的第1部分中,收集了缺陷率的测量值以及物理和电气(DC和RF)性能特征的变化,并与几个(最多7个)不同的商业LTCC铸造厂生产的样品进行了比较。对经过特殊设计的PCM(过程控制监视器)测试结构的具有统计意义的样本大小进行了测试和分析。该研究的第2部分使用了在LTCC中设计和制造的定制SEC(标准评估电路)模块基板。通过大批量的SiP装配线对样品进行了处理,以评估每种LTCC在实际制造环境中与倒装芯片和EGA工艺的兼容性。在研究的第3部分中,收集了由单个LTCC供应商跨多个制造批次生产的嵌入式组件的可重复性的统计数据。研究的每个部分都揭示了LTCC材料系统之间的显着差异,无论是在制造嵌入式无源结构时的工艺控制水平,还是与标准装配工艺的兼容性。

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