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Quantitative measurement of the local surface potential of pi-conjugated nanostructures: A Kelvin probe force microscopy study

机译:π共轭纳米结构的局部表面电势的定量测量:开尔文探针力显微镜研究

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We describe a systematic study on the influence of different experimental conditions on the Kelvin probe force microscopy (KPFM) quantitative determination of the local surface potential (SP) of organic semiconducting nanostructures of perylene-bis-dicarboximide (PDI) self-assembled at surfaces. We focus on the effect of the amplitude, frequency, and phase of the oscillating voltage on the absolute surface potential value of a given PDI nanostructure at a surface. Moreover, we investigate the I role played by the KPFM measuring mode employed and the tip-sample distance in the surface potential mapping by lift-mode KPFM. We define the ideal general conditions to obtain a reproducible quantitative estimation of the SP and we find that by decreasing the tip-sample distance, the area of substrate contributing to the recorded SP in a given location of the surface becomes smaller. This leads to an improvement of the lateral resolution, although a more predominant effect of polarization is observed. Thus, quantitative SP measurements of these nanostructures become less reliable and the SP signal is more unstable. We have also devised a semi-quantitative theoretical model to simulate the KPFM image by taking into account the interplay of the different work functions of tip and nanostructure as well as the nanostructure polarizability. The good agreement between the model and experimental results demonstrates that it is possible to simulate both the change in local SP at increasing tip-sample distances and the 2D potential images obtained on PDI/highly oriented pyrolytic graphite samples. These results are important as they make it possible to gain a quantitative determination of the local surface potential of pi-conjugated nanostructures; thus, they pave the way towards the optimization of the electronic properties of electroactive nanometer-scale architectures for organic (nano)electronic applications.
机译:我们描述了系统研究不同的实验条件对Kelvin探针力显微镜(KPFM)定量测定自组装在表面的per-双-二苯甲酰亚胺(PDI)有机半导体纳米结构的局部表面电势(SP)的系统研究。我们关注振荡电压的幅度,频率和相位对表面给定PDI纳米结构的绝对表面电势值的影响。此外,我们研究了采用KPFM测量模式的I角色,以及通过提升模式KPFM在表面电势映射中的尖端样本距离。我们定义了理想的一般条件以获得SP的可重现的定量估计,并且我们发现通过减小尖端采样距离,在给定的表面位置中有助于记录的SP的基板面积变小。尽管观察到了更主要的偏振效应,但这导致了横向分辨率的提高。因此,这些纳米结构的定量SP测量变得不太可靠,并且SP信号更加不稳定。我们还设计了一种半定量理论模型,通过考虑尖端和纳米结构的不同功函数之间的相互作用以及纳米结构的极化率来模拟KPFM图像。模型与实验结果之间的良好一致性表明,有可能模拟在尖端样品距离增加时局部SP的变化以及在PDI /高取向热解石墨样品上获得的二维电势图像。这些结果很重要,因为它们可以定量确定π共轭纳米结构的局部表面电势。因此,它们为优化有机(纳米)电子应用电活性纳米级体系结构的电子性能铺平了道路。

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