METHOD FOR MEASURING SURFACE POTENTIAL USING KELVIN PROBE FORCE MICROSCOPY

摘要

A method for measuring surface potential using a Calvin probe microscope according to an embodiment of the present invention includes the steps of measuring a surface potential value of a standard sample using at least one conductive tip and measuring at least one conductive tip to a surface potential value Measuring the surface potential value of the measurement sample using the calibrated probe microscope with the classified conductive tip, comparing the surface potential value of the standard sample with the surface potential value of the measurement sample, And correcting the potential value.