Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

摘要

We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.