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ARC 2014 Over-Clocking KLT Designs on FPGAs under Process, Voltage, and Temperature Variation

机译:在过程,电压和温度变化下,FPGA上的ARC 2014超时钟KLT设计

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摘要

Karhunen-Loeve Transformation is a widely used algorithm in signal processing that often implemented with high-throughput requisites. This work presents a novel methodology to optimise KLT designs on FPGAs that outperform typical design methodologies, through a prior characterisation of the arithmetic units in the datapath of the circuit under various operating conditions. Limited by the ever-increasing process variation, the delay models available in synthesis tools are no longer suitable for extreme performance optimisation of designs, and as they are generic, they need to consider the worst-case performance for a given fabrication process. Hence, they heavily penalise the maximum possible achieved performance of a design by leaving safety margin. This work presents a novel unified optimisation framework which contemplates a prior characterisation of the embedded multipliers on the target FPGA device under process, voltage, and temperature variation. The proposed framework allows a design space exploration leading to designs without any latency overheads that achieve high throughput while producing less errors than typical methodologies, operating with the same throughput. Experimental results demonstrate that the proposed methodology outperforms the typical implementation in three real-life design strategies: high performance, low power, and temperature variation; and it produced circuit designs that performed up to 18dB better when over-clocked.
机译:Karhunen-Loeve变换是一种在信号处理中被广泛使用的算法,通常以高吞吐量的要求来实现。这项工作提出了一种新颖的方法,可以通过在各种工作条件下对电路数据路径中的算术单元进行预先表征,来优化优于典型设计方法的FPGA上的KLT设计。受制于不断变化的工艺变化,综合工具中可用的延迟模型不再适合于设计的极端性能优化,并且由于它们是通用的,因此它们需要考虑给定制造工艺的最坏情况下的性能。因此,它们通过留有安全余量,严重损害了设计的最大可能实现性能。这项工作提出了一个新颖的统一优化框架,该框架考虑了在过程,电压和温度变化下目标FPGA器件上嵌入式乘法器的先验特性。所提出的框架允许进行设计空间探索,从而在没有任何等待时间开销的情况下进行设计,从而实现了高吞吐量,同时产生的误差小于以相同吞吐量运行的典型方法。实验结果表明,所提出的方法在三种实际设计策略中优于典型的实现方法:高性能,低功耗和温度变化;并且它产生的电路设计在超频时性能提高了18dB。

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