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Se-doping dependence of the transport properties in CBE-grown InAs nanowire field effect transistors

机译:CBE生长的InAs纳米线场效应晶体管中传输特性的Se掺杂依赖性

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摘要

We investigated the transport properties of lateral gate field effect transistors (FET) that have been realized by employing, as active elements, (111) B-oriented InAs nanowires grown by chemical beam epitaxy with different Se-doping concentrations. On the basis of electrical measurements, it was found that the carrier mobility increases from 103 to 104 cm2/(V × sec) by varying the ditertiarybutyl selenide (DtBSe) precursor line pressure from 0 to 0.4 Torr, leading to an increase of the carrier density in the transistor channel of more than two orders of magnitude. By keeping the DtBSe line pressure at 0.1 Torr, the carrier density in the nanowire channel measures ≈ 5 × 1017 cm-3 ensuring the best peak transconductances (> 100 mS/m) together with very low resistivity values (70 Ω × μm) and capacitances in the attofarad range. These results are particularly relevant for further optimization of the nanowire-FET terahertz detectors recently demonstrated.>PACS: 73.63.-b, 81.07.Gf, 85.35.-p
机译:我们研究了横向栅场效应晶体管(FET)的传输特性,该晶体管已通过采用化学束外延生长不同浓度的Se掺杂的(111)B取向InAs纳米线作为活性元素来实现。根据电学测量,发现载流子迁移率从10 3 增加到10 4 cm 2 /(V×sec)通过将硒酸二叔丁基酯(DtBSe)的前体线压力从0改变到0.4 Torr,导致晶体管沟道中载流子密度的增加超过两个数量级。通过将DtBSe线路压力保持在0.1 Torr,纳米线通道中的载流子密度为≈5×10 17 cm -3 ,以确保最佳的峰值跨导(> 100 mS / m)以及极低的电阻率值(70Ω×μm)和attofarad范围内的电容。这些结果与最近展示的纳米线FET太赫兹探测器的进一步优化特别相关。> PACS: 73.63.-b,81.07.Gf,85.35.-p

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