I2C串行接口数字芯片SCG103测试方法

摘要

本文概述了I2C串行总线协议原理，研究了采用I2C串行接口的数字芯片的测试方法。在此基础上，研究了I2C串行接口时钟/日历芯片SCG103的测试方案，并在BC3192测试系统中开发了测试程序，成功实现了测试。该测试方法同样适用于类似的I2C串行接口数字芯片。%This article discusses the principle of I2C serial bus protocol,and researched the test method for digital IC with I2C serial interface. Based on that,researched the test solution for SCG103,a real time clock/calendar IC with I2C serial interface.Test procedures are developed and successfully performed in BC3192 system.This test method is also applicable to similar IC with I2C serial interface.