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Morphological evolution during molecular beam epitaxy of germanium/germanium(001) and silicon/germanium(111).

机译:锗/锗(001)和硅/锗(111)的分子束外延过程中的形貌演变。

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摘要

The evolution of morphology and microstructure during Ge homoepitaxial growth, especially at low temperatures of 150°C to 250°C, is strongly influenced by the growth kinetics. Morphological evolution on singular and vicinal surfaces is driven by instabilities during epitaxial growth. In my experimental study, I have investigated the influence of substrate vicinality and atomic hydrogen exposure on the Ge(001) epitaxial morphology.; Vicinal surfaces of varying miscut are created on singular Ge(001) substrates by laser texturing. Epitaxial growth on these textured surfaces show a morphological transition from mound structures on singular surfaces to ridge structures on vicinal surfaces miscut along 110> for miscut angles >2°. For Ge film thickness of 50 to 450 nm deposited in the temperature range of 150°C to 250°C the root-mean-square (rms) roughness of the ridges increases with miscut angle (from 0.3 nm to 1 nm), while the lateral roughness length scale decreases with miscut.; I have studied the influence of atomic hydrogen during low temperature epitaxy (150°C to 300°C) on singular and vicinal Ge surface. Atomic hydrogen adsorbs on Ge surfaces and reduces the surface diffusion of Ge adatoms during epitaxial growth. Atomic hydrogen exposure during epitaxy changes the mound morphology of epitaxial structures to a planar surface on singular Ge(001). Despite the morphological transition to a smoother surface, the epitaxial thickness is reduced at 150°C from ≈430 nm to 35 nm.; I have investigated the evolution of islands during the heteroepitaxy of Si on Ge(111). This study involves a systematic investigation of the island nucleation kinetics, morphology and microstructure for various thicknesses and deposition temperatures. The islands formed are predominantly three-dimensional. A large density of islands (>1011 cm−2) is observed during growth at low temperatures (550°C) and growth at higher temperatures (>600°C) yield a lower density of islands. The activation energy for the nucleation of these islands is ≈1.7 eV. The islands deposited at temperatures 550°C are predominantly coherent, while those formed at higher temperatures are incoherent, with a transition size of ≈18 nm.
机译:Ge同质外延生长期间,尤其是在150°C至250°C的低温下,形貌和微观结构的演变受到生长动力学的强烈影响。外延生长过程中的不稳定性驱动奇异表面和邻近表面的形态演化。在我的实验研究中,我研究了底物附近和原子氢暴露对Ge(001)外延形貌的影响。通过激光纹理化,在奇异的Ge(001)基底上形成了变化不当的邻面。这些纹理化表面上的外延生长显示出从奇异表面上的丘结构到相邻表面上的脊结构的形态学过渡,这些结构沿<110>错切角度> 2°错切。对于在150°C至250°C的温度范围内沉积的厚度为50至450 nm的Ge膜,脊的均方根(rms)粗糙度会随着误切角(从0.3 nm到1 nm)而增加,而横向粗糙度长度尺度因切割不当而减小。我研究了低温外延(150°C至300°C)期间原子氢对奇异Gevic表面的影响。原子氢吸附在Ge表面上,并在外延生长期间减少了Ge原子的表面扩散。外延过程中原子氢的暴露将外延结构的土墩形态改变为奇异Ge(001)上的平面。尽管从形态学过渡到更光滑的表面,外延厚度在150℃下从约430nm减小到约35nm。我研究了在Ge(111)上Si异质外延过程中岛的演变。这项研究涉及对各种厚度和沉积温度的岛形核动力学,形态和微观结构的系统研究。形成的岛主要是三维的。在低温(<550°C)生长期间和高温(> 600°C)生长期间观察到较大的岛密度(> 10 11 cm −2 ) )产生较低的岛密度。这些岛的成核活化能为&ap; 1.7 eV。在<550℃的温度下沉积的岛主要是相干的,而在较高温度下形成的岛是不相干的,过渡尺寸为约18nm。

著录项

  • 作者

    Raviswaran, Arvind.;

  • 作者单位

    University of Illinois at Urbana-Champaign.;

  • 授予单位 University of Illinois at Urbana-Champaign.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2002
  • 页码 162 p.
  • 总页数 162
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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