Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM

摘要

A random intrinsic chip ID method generates a pair of 4Kb binary strings using retention fails in 32nm SOI embedded DRAM. Hardware results show ID overlap distance mean=0.58 and σ=0.76 and demonstrate 100% authentication for 346 chips. The analytical model predicts > 99.999% unique IDs for 10⁶ parts.