首页> 外文会议>Symposium on Materials Science of Microelectromechanical Systems( MEMS) Devices Ⅲ Nov 27-28, 2000, Boston, Massachusetts, U.S.A. >Phenomenological Model of Non-Evaporated Getter for Micro-electromechanical Systems (MEMS) Applications
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Phenomenological Model of Non-Evaporated Getter for Micro-electromechanical Systems (MEMS) Applications

机译:微机电系统(MEMS)应用中非蒸发吸气剂的现象学模型

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摘要

There has been increasing interest in the development and use of micro-electromechanical systems (MEMS) for various applications. Some MEM devices such as gyroscopes, accelerometers and bolometers, must be sealed under vacuum, at pressures below 10 millitorr, for efficient operation. A gas absorbing material (getter) is placed in the packages of these devices, to help maintain vacuum levels over service lives of many years. Heating under vacuum, just prior to sealing the package, activates getter, of this type. This study was undertaken to develop a model that could be used to estimate the quantity of getter needed as well as optimize the activation process subject to process constraints on time and temperature. The material studied was a titanium and zirconium-based alloy (7:3 by weight) non-evaporable getter in the form of strips produced by SAES Getters. The zirconium alloy consisted of zirconium (70.0%), vanadium (24.6%) and iron (5.4%) by weight. The getter was analyzed under different ambient conditions of temperature, time and atmospheric pressure. Auger electron spectroscopy (AES) depth profiling was used to analyze the diffusion depth of the contaminant gases absorbed by the getter material under each condition. The data acquired from the depth profiles were fit to a simple diffusion model. This model is currently being validated, by activating the getter material under various ambient conditions, and measuring pressures and gas compositions inside packages using a residual gas analyzer (RGA). The utility of this model for optimization of getter activation and estimating package vacuum levels over time will be discussed.
机译:对于各种应用的微机电系统(MEMS)的开发和使用已经引起了越来越多的兴趣。为了有效运行,某些MEM设备(例如陀螺仪,加速度计和辐射热计)必须在真空中,低于10毫托的压力下密封。吸气材料(吸气剂)被放置在这些设备的包装中,以帮助在多年的使用寿命中保持真空度。在密封包装之前,在真空下加热会激活这种吸气剂。进行这项研究是为了开发一个模型,该模型可用于估计所需的吸气剂的量,并根据时间和温度的过程约束来优化激活过程。所研究的材料是钛和锆基合金(重量比为7:3)的不挥发吸气剂,其形式为SAES吸气剂。锆合金由按重量计的锆(70.0%),钒(24.6%)和铁(5.4%)组成。在温度,时间和大气压的不同环境条件下分析吸气剂。使用俄歇电子能谱(AES)深度分析来分析在每种情况下吸气剂材料吸收的污染物气体的扩散深度。从深度剖面获取的数据适合简单的扩散模型。该模型目前正在验证中,方法是在各种环境条件下激活吸气材料,并使用残留气体分析仪(RGA)测量包装内的压力和气体成分。将讨论该模型用于优化吸气剂活化和随时间推移估算包装真空度的实用性。

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