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Development of New Electrodeposited Copper Foll

机译:新型电沉积铜箔的研制

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Development Of New Electrodeposited Copper Foil A new copper foil has been developed for the recent trend of higher density and thinner printed circuit boards (PCBs). First, VLP foil with smaller crystal grain size than the conventional copper foil was developed focusing on the fact that the etching speed becomes faster as the crystal grain size becomes smaller. Then, observing the phenomenon which takes place in the etching process from a microscopic point of view, the shiny side (S side) of the VLP foil was uniformly nodulized (treated) to have the best etching characteristics. Thus the new copper foil was developed. This new copper foil was compared with a conventional copper foil for evaluation. It was found that with the new copper foil the etched circuit pattern was excellent with minimal embedded copper in the circuit board and dielectric quality between the lines and layers was high. Therefore, this new copper foil can be expected to meet the demand for higher density and thinner products.
机译:新的电沉积铜箔的开发为了满足更高密度和更薄印刷电路板(PCB)的最新趋势,已经开发了一种新的铜箔。首先,着眼于随着晶粒尺寸变小蚀刻速度变得更快的事实,开发了具有比常规铜箔小的晶粒尺寸的VLP箔。然后,从微观的角度观察在蚀刻过程中发生的现象,将VLP箔的发亮面(S面)均匀地结节(处理)以具有最佳的蚀刻特性。因此,开发了新的铜箔。将该新的铜箔与常规的铜箔进行比较以进行评估。已经发现,使用新的铜箔,蚀刻的电路图案非常好,并且电路板中的嵌入铜最少,并且线和层之间的介电质量很高。因此,可以期望这种新型铜箔能够满足对更高密度和更薄产品的需求。

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