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Photoimageable Solder Resists - Optimising The Processing

机译:可光成像的阻焊剂-优化工艺

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Photoimageable solder resists - Optimising the Processing. Greatest care must be taken when applying and subsequently processing today's photoimageable solder resists if they are to fulfil the requirements of maximum resolution and an homogeneous ink surface as well as achieve their specific mechanical, chemical and electrical properties. This paper describes possibilities for increasing the coating quality of photoimageable solder resists applied by curtain coating by modifying equipment and making potential alterations to the processing steps. In detail, these possibilities are measures to achieve a minimum of bubbles in the coating and to incresase the coating thickness on conductor edges while applying the same wet ink weight, optimisation of the exposure process, further improved free-development also of micro through-plated holes and prevention of surface contamination of freely-developed metal substrates (e.g. SMD pads) by ink constituents during the developing process which may lead to incomplete hot-air levelling or incomplete wetting during electroless Ni/Au of the affected surfaces.
机译:可光成像的阻焊剂-优化工艺。如果要满足最大分辨率和均匀油墨表面的要求,并达到其特定的机械,化学和电气性能,则在应用和后续加工当今的可光成像阻焊剂时必须格外小心。本文介绍了通过改进设备和对工艺步骤进行潜在更改来提高通过幕涂方式涂覆的可光成像阻焊剂的涂层质量的可能性。详细地讲,这些可能性是在施加相同的湿墨重量的同时,使涂层中的气泡最少并增加导体边缘上的涂层厚度的措施,优化了曝光工艺,进一步改善了微通孔镀层的自由显影性。在显影过程中,油墨成分会打孔并防止自由显影的金属基材(例如SMD焊盘)受到表面污染,这可能会在受影响的表面化学镀Ni / Au期间导致热风流平或润湿不完全。

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