首页> 外文会议>Power Semiconductor Devices amp; IC's, 2005 IEEE International Symposium on; Lake Buena Vista,FL,USA >A novel, wafer-level stacking method for low-chip yield and non-uniform, chip-size wafers for MEMS and 3D SIP applications
【24h】

A novel, wafer-level stacking method for low-chip yield and non-uniform, chip-size wafers for MEMS and 3D SIP applications

机译:一种新颖的晶圆级堆叠方法,用于低芯片良率和用于MEMS和3D SIP应用的芯片尺寸不均匀的晶圆

获取原文
获取原文并翻译 | 示例

摘要

Stacking of wafers with low chip-yield and non uniform chips size is developed for MEMS and 3D packaging applications. Stacking of MEMS and ASIC wafers one over other is difficult due to difference in chip yield and chip size. A cap wafer which is used fo
机译:针对MEMS和3D封装应用,开发出了具有低芯片成品率和不均匀芯片尺寸的晶圆堆叠。由于芯片成品率和芯片尺寸的差异,很难将MEMS和ASIC晶圆彼此堆叠。用于

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号