首页> 外文会议>Pits and pores 4: New materials and applications - in memory of ulrich gosele >Rational Design of Etchants for Electroless Porous Silicon Formation
【24h】

Rational Design of Etchants for Electroless Porous Silicon Formation

机译:化学形成多孔硅的蚀刻剂的合理设计

获取原文
获取原文并翻译 | 示例

摘要

From fundamental considerations of the surface chemistry of Si etching in fluoride solutions as well as pore formation and propagation, we develop a mechanistic understanding of what must be known for rational development of etchants: (I) an acidic fluoride solution because the presence of OIF promotes step flow etching, (2) sufficiently high fluoride concentration compared to the oxidant concentration, (3) the oxidant must be able to inject holes into the Si valance band at a sufficient rate, hence E° > ~0.7 V is required, (4) oxide formation needs to be slow or nonexistent so as to avoid the formation of a uniform oxide and associated electropolishing, (5) reduction of the oxidant must lead to soluble products, (6) film homogeneity is enhanced if the oxidant's half-reaction does not evolve gas, and finally (7) the net etching reaction has to be sufficiently anisotropic to support pore nucleation and propagation.
机译:基于对氟化物溶液中Si蚀刻的表面化学以及孔形成和传播的基本考虑,我们对合理开发蚀刻剂必须了解的机理有了如下的理解:(I)酸性氟化物溶液,因为OIF的存在会促进分步流蚀刻,(2)与氧化剂相比,氟化物浓度足够高,(3)氧化剂必须能够以足够的速率向Si价带注入空穴,因此需要E°>〜0.7 V,(4 )氧化物的形成需要缓慢或不存在,以避免形成均匀的氧化物和相关的电抛光;(5)氧化剂的还原必须导致可溶产物;(6)如果氧化剂的半反应确实可以增强膜的均匀性不会释放出气体,最后(7)净蚀刻反应必须具有足够的各向异性,以支持孔的形核和扩散。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号