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Rational Design of Etchants for Electroless Porous Silicon Formation

机译:无电孔硅形成的蚀刻剂的理性设计

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From fundamental considerations of the surface chemistry of Si etching in fluoride solutions as well as pore formation and propagation, we develop a mechanistic understanding of what must be known for rational development of etchants: (1) an acidic fluoride solution because the presence of OH- promotes step flow etching, (2) sufficiently high fluoride concentration compared to the oxidant concentration, (3) the oxidant must be able to inject holes into the Si valance band at a sufficient rate, hence E° > ~0.7 V is required, (4) oxide formation needs to be slow or nonexistent so as to avoid the formation of a uniform oxide and associated electropolishing, (5) reduction of the oxidant must lead to soluble products, (6) film homogeneity is enhanced if the oxidant's half-reaction does not evolve gas, and finally (7) the net etching reaction has to be sufficiently anisotropic to support pore nucleation and propagation.
机译:从氟化物溶液中Si蚀刻表面化学的基本考虑以及孔隙形成和繁殖中,我们对蚀刻剂合理发育必须所知的机械理解:(1)酸性氟化物溶液,因为OH-的存在促进步骤流动蚀刻,(2)与氧化剂浓度相比,(3)氧化剂必须能够以足够的速率将孔注入Si值带中,因此需要E°>〜0.7V( 4)氧化物形成需要缓慢或不存在,以避免形成均匀氧化物和相关的电抛光,(5)氧化剂的还原必须导致可溶性产物,如果氧化剂的半反应,膜均匀性增强不发展气体,最后(7)净蚀刻反应必须足够各向异性以支持孔成核和繁殖。

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