首页> 外国专利> ETCHANT USED FOR ETCHING POROUS SILICON, ETCHING METHOD USING IT, AND MANUFACTURE OF SEMICONDUCTOR BASE USING IT

ETCHANT USED FOR ETCHING POROUS SILICON, ETCHING METHOD USING IT, AND MANUFACTURE OF SEMICONDUCTOR BASE USING IT

机译:用于蚀刻多孔硅的蚀刻剂,使用该蚀刻剂的蚀刻方法以及使用该蚀刻剂制造半导体基体

摘要

PURPOSE:To etch a porous Si uniformly and effectively without contamination in a semiconductor process, to accurately and selectively remove a porous Si which is formed on the same substrate together with a non-porous Si by etching, and to form an Si crystal layer excellent in crystallinity on an insulating substrate. CONSTITUTION:A mixed solution of hydrofluoric acid, buffered hydrofluoric acid and/or alcohol, and hydrogen peroxide water is used as etchant to etch a porous silicon, an etching method is carried out by use of this etchant, and a semiconductor substrate is manufactured with this etchant.
机译:目的:在半导体工艺中均匀有效地腐蚀多孔硅而不会受到污染,通过腐蚀准确而有选择地去除在同一衬底上形成的多孔硅以及无孔硅,并形成优异的硅晶体层在绝缘基板上的结晶度。组成:氢氟酸,缓冲氢氟酸和/或醇和过氧化氢水的混合溶液用作蚀刻剂,以蚀刻多孔硅,使用该蚀刻剂进行蚀刻方法,并使用这种蚀刻剂。

著录项

  • 公开/公告号JPH06342784A

    专利类型

  • 公开/公告日1994-12-13

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP19920059118

  • 申请日1992-02-14

  • 分类号H01L21/308;H01L21/306;

  • 国家 JP

  • 入库时间 2022-08-22 04:23:05

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