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Effects of Nanosecond Pulsed Electrical Fields (nsPEFs) on the Cell Cycle of CHO and Jurkat Cells

机译:纳秒脉冲电场(nsPEFs)对CHO和Jurkat细胞周期的影响

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Exposure to nano-second pulsed electrical fields (nsPEFs) can cause poration of external and internal cell membranes, DNA damage, and disassociation of cytoskeletal components, all of which are capable of disrupting a cell's ability to replicate. Variations between cell lines in membrane and cytoskeletal structure as well as in survival of nsPEF exposure should correspond to unique line-dependent cell cycle effects. Additionally, phase of cell cycle during exposure may be linked to differential sensitivities to nsPEFs across cell lines, as DNA structure, membrane elasticity, and cytoskeletal structure change dramatically during the cell cycle. Populations of Jurkat and Chinese Hamster Ovary (CHO) cells were examined post-exposure (10 ns pulse trains at 150kV/cm) by analysis of DNA content via propidium iodide staining and flow cytometric analysis at various time points (1,6, and 12h post-exposure) to determine population distribution in cell cycle phases. Additionally, CHO and Jurkat cells were synchronized in G1/S and G2/M phases, pulsed, and analyzed to evaluate role of cell cycle phase in survival of nsPEFs. CHO populations recovered similarly to sham populations post-nsPEF exposure and did not exhibit a phase-specific change in response. Jurkat cells exhibited considerable apoptosisecrosis in response to nsPEF exposure and were unable to recover and proliferate in a manner similar to sham exposed cells. Additionally, Jurkat cells appear to be more sensitive to nsPEFs in G2/M phases than in Gl/S phases. Recovery of CHO populations suggests that nsPEFs do not inhibit proliferation in CHO cells; however, inhibition of Jurkat cells post-nsPEF exposure coupled with preferential cell death in G2/M phases suggest that cell cycle phase during exposure may be an important factor in determining nsPEF toxicity in certain cell lines. Interestingly, CHO cells have a more robust and rigid cytoskeleton than Jurkat cells which is thought to contribute to their ability to survive nsPEFs. The ability of the CHO cytoskeleton to recover and complete mitosis after nsPEF-induced damage in G2/M phase may be integral to the cell line's higher tolerance of nsPEF exposure.
机译:暴露于纳秒级脉冲电场(nsPEF)可能会导致细胞内部和外部细胞膜穿孔,DNA损伤以及细胞骨架成分解离,所有这些均会破坏细胞的复制能力。膜和细胞骨架结构中细胞系之间的变化以及nsPEF暴露存活的变化应对应于独特的细胞系依赖性细胞周期效应。另外,暴露期间细胞周期的阶段可能与跨细胞系对nsPEFs的敏感性不同有关,因为在细胞周期中DNA结构,膜弹性和细胞骨架结构发生了巨大变化。暴露后(150kV / cm,10 ns脉冲序列),通过碘化丙啶染色分析DNA含量并在不同时间点(1、6和12h)进行流式细胞术分析,检查了Jurkat和中国仓鼠卵巢(CHO)细胞的种群暴露后)以确定细胞周期阶段的种群分布。此外,CHO和Jurkat细胞在G1 / S和G2 / M期同步化,脉冲化并进行分析,以评估细胞周期期在nsPEFs存活中的作用。 nsPEF暴露后,CHO种群的恢复与假种群相似,并且在响应中未表现出阶段特异性变化。 Jurkat细胞对nsPEF暴露有反应,显示出相当大的凋亡/坏死,无法以与假暴露细胞相似的方式恢复和增殖。另外,在G2 / M期中,Jurkat细胞对nsPEF似乎比在G1 / S期中更敏感。 CHO种群的恢复表明nsPEF不会抑制CHO细胞的增殖。然而,nsPEF暴露后Jurkat细胞的抑制以及G2 / M期的优先细胞死亡表明,暴露期间的细胞周期阶段可能是确定某些细胞系nsPEF毒性的重要因素。有趣的是,CHO细胞比Jurkat细胞具有更强壮,更坚硬的细胞骨架,这被认为有助于其在nsPEFs中生存。 nsPEF诱导的G2 / M期损伤后,CHO细胞骨架恢复并完成有丝分裂的能力可能是细胞系对nsPEF暴露的较高耐受性所不可或缺的。

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