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Electro-forming of vacancy-doped metal-SrTiOa-metal structures

机译:空位掺杂金属-SrTiOa-金属结构的电铸

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Resistance switching in metal - insulator - metal (MIM) structures with transition metal oxides as the insulator material is a promising concept for upcoming non-volatile memories. The electronic properties of transition metal oxides can be tailored in a wide range by doping and external fields. In this study SrTiO_3 single crystals are subjected to high temperature vacuum annealing. The vacuum annealing introduces oxygen vacancies, which act as donor centers. MIM stacks are produced by physical vapor deposition of Au and Ti contacts on the front and rear face of the SrTiO_3 crystal. The time dependent forming of the MIM stacks under an external voltage is investigated for crystals with varying bulk conductivities. For continued formation, the resistivity increases up to failure of the system where no current can be measured anymore and switching becomes impossible.
机译:具有过渡金属氧化物作为绝缘体材料的金属-绝缘体-金属(MIM)结构中的电阻转换是即将到来的非易失性存储器的一个有前途的概念。过渡金属氧化物的电子性能可通过掺杂和外部场在大范围内调整。在这项研究中,对SrTiO_3单晶进行了高温真空退火。真空退火引入氧空位,其充当供体中心。 MIM堆叠是通过在SrTiO_3晶体的正面和背面通过物理气相沉积Au和Ti触点而产生的。对于具有变化的体电导率的晶体,研究了在外部电压下MIM叠层随时间的变化情况。对于连续的形成,电阻率增加到系统故障为止,在该系统中不再能够测量电流并且切换变得不可能。

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