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Electrochemical Migration on Lead-Free Soldering of Pcbs

机译:铅无铅焊接中的电化学迁移

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It is well known that in printed circuits boards assembled by SMT technology may occur electrochemical migration (ECM). The electrochemical migration may become a potential reliability problem in electronic soldering when lead free technology is used in soldering electronic devices. Electrochemical migration is an electrochemical process where metal on an insulating material, in a humid environment and under an applied electric field, leaves its initial location in ionic form and redeposits. In a PCB two adjacents terminal may behave as electrodes so the dendrites grow from cathode to anode. A structure with a comb shape printed on FR4 substrate was used in the experiments. The distance between the fingers was 105 or 254 micron, in order to simulate a real distance between dispositive terminals. The parameters considered during the experiments were surface finishing, solder paste composition, distance between terminals and applied voltage. Al the experiments were performed two times. Tin was the main metal that migrates.
机译:众所周知,在通过SMT技术组装的印刷电路板中可能会发生电化学迁移(ECM)。当在焊接电子设备中使用无铅技术时,电化学迁移可能会成为电子焊接中潜在的可靠性问题。电化学迁移是一种电化学过程,其中绝缘材料上的金属在潮湿环境中和施加的电场下会以离子形式离开其初始位置并重新沉积。在PCB中,两个相邻的端子可以充当电极,因此树枝状晶体从阴极生长到阳极。实验中使用了在FR4基板上印有梳状的结构。手指之间的距离为105或254微米,以模拟沉积端子之间的实际距离。实验期间考虑的参数是表面处理,焊膏成分,端子之间的距离和施加的电压。所有实验进行两次。锡是迁移的主要金属。

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