Laser-induced forward transfer of 40nm Chromium film using ultrashort laser pulses

摘要

Experiments of laser-induced forward transfer (LIFT) have been performed using ultrashort laser pulses (SOOnm, lOOfs). 40nm of Cr thin film have been transferred on glass and Silicon acceptor substrates in different conditions. The analysis of the deposits was carried out by optical and electronic scanning microscopy. An optimisation of the process has been carried out and a good resolution of the patterns was obtained. The dynamics of the plume has been monitored with a gated ICCD camera and the images analysis gave us indications on the transfer of the material.