ELECTRICAL CHARACTERIZATION OF NANOSCALE MATERIAL INTERFACES RANGING FROM SINGLE NANORODS TO FUNCTIONAL SOLAR CELL DEVICES USING SCANNING KELVIN PROBE MICROSCOPY

摘要

Comprehensive characterization of nanoscale material interfaces remains one challenging research direction in nanoscience and nanotechnology. Advancements in the science of nanocrystal (NC) synthesis has lead to the design and synthesis of single- and multi- component nanostructures that consist of combinations of semiconducting, metallic, oxide, magnetic, or other material components. However, material interfaces often govern the physical properties of the overall structure.