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Process for the spatial and temporal scanning of ultrafast electrical signals of a sample using a cantilever probe made of semiconductor material for scanning probe microscopy
Process for the spatial and temporal scanning of ultrafast electrical signals of a sample using a cantilever probe made of semiconductor material for scanning probe microscopy
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机译:使用半导体材料制成的悬臂式探针进行样品超快电信号的时空扫描的方法,用于扫描探针显微镜
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摘要
The invention relates to a method for carrying out the spatial and temporal scanning of ultrafast signals of a sample and for generating ultrafast electric signals, whereby a cantilever probe made of a semiconductor material is used. Said probe comprises a conductor path structure with an integrated photoconductive PL-switch that can be actuated by light action. The photoconductive PL-switch comprises an essentially gradual transmission function, whereby the convoluted signal of the PL-switch which is detected by an evaluating electronic unit is subjected to a differentiation in order to scan the ultrafast signals. The method for generating ultrafast electric pulses is characterized in that a potential is applied between at least two conductor paths and the signal generated by the photoconductive PL-switch is subjected to a differentiation and is injected into the sample. The invention also relates to a cantilever probe for carrying out said method.
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