SPATIAL AND TEMPORAL SCANNING OF ULTRAFAST ELECTRIC SIGNALS OF A CANTILEVER PROBE USED FOR RASTER PROBE MICROSCOPY

摘要

The invention relates to a method for carrying out the spatial and temporal scanning of ultrafast signals of a sample and for generating ultrafast electric signals, whereby a cantilever probe made of a semiconductor material is used. Said probe comprises a conductor path structure with an integrated photoconductive PL-switch that can be actuated by light action. The photoconductive PL-switch comprises an essentially gradual transmission function, whereby the convoluted signal of the PL-switch which is detected by an evaluating electronic unit is subjected to a differentiation in order to scan the ultrafast signals. The method for generating ultrafast electric pulses is characterized in that a potential is applied between at least two conductor paths and the signal generated by the photoconductive PL-switch is subjected to a differentiation and is injected into the sample. The invention also relates to a cantilever probe for carrying out said method.