扫描Kelvin探针力显微镜:工作原理及在材料腐蚀研究中的应用

摘要

Scanning Kelvin probe force microscopy (SPFKM)is a material measuring and characterizing technique which ap-plies scanning Kelvin probe on the basis of atomic force microscopy (AFM)and has been gaining momentum in recent years.It in-volves simultaneously the nanometer-level topography measurement and the in-situ high-resolution volta potential mapping,thereby providing a novel insight in investigating the mechanisms of materials'corrosion behaviours.The present paper sketches out the prin-ciples with respect to the two working modes of SKPFM,summarizes the unresolved issues that have emerged in SPFKM's applica-tion,and also renders a comparative discussion between SKPFM and the traditional SKP technique.The review offers an elaborate delineation about the application of SKPFM in corrosion science,and ends with a rough description of the opportunities and challen-ges.%扫描Kelvin探针力显微镜(SKPFM)是在原子力显微镜(AFM)的基础上应用扫描Kelvin探针(SKP)技术开发的检测表征手段,它能够在获取材料表面纳米级分辨率形貌的同时,原位得到样品表面高分辨率的接触电势差分布图,为揭示腐蚀反应机理提供了崭新的思路,近年来发展迅速.本文介绍了 SKPFM两种工作模式的基本原理,总结了 SKPFM在应用中的问题,并讨论了 SKPFM和传统扫描Kelvin探针技术(SKP)的优缺点,重点综述了 SKPFM在腐蚀科学研究中的应用,最后展望了 SKPFM的发展方向与应用前景.