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Analysis of packaging effects on wire bonder made microtransformer chips

机译:金属丝制造芯片卷材的包装效果分析

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We present the fabrication and characterization of microtransformer chips, based on wire bonded microcoils which are encapsulated in a Polydimethylsiloxane (PDMS) package. Our investigations focused on the degradation in electrical performance due to the higher dielectric constant of PDMS compared to air. We further studied the thermo-mechanical induced strain on the system due to thermal expansion of the package at temperatures up to 250°C. According to the measurements, encapsulating the chips decreased the resonance frequency and the quality factor near the resonance. However, both the maximum quality factor and the power efficiency were not affected by the encapsulation. Furthermore, induced thermo-mechanical strains due to the mismatched coefficients of thermal expansion of the chip and the packaging materials did not decrease the mechanical integrity of the SU-8 post and the coil itself.
机译:我们介绍了微量反向形状芯片的制造和表征,基于引线键合的微膜,其包封在聚二甲基硅氧烷(PDMS)包装中。我们的调查专注于电气性能的降解,由于PDMS的介电常数与空气相比具有更高的介电常数。我们进一步研究了系统上的热机械诱导应变,由于封装在高达250°C的温度下的热膨胀。根据测量,封装芯片的谐振频率降低和谐振附近的质量因子。但是,最大质量因数和功率效率都不受封装的影响。此外,由于芯片的热膨胀系数不匹配和包装材料而导致的热机械菌株没有降低SU-8柱和线圈本身的机械完整性。

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