首页> 外文会议>SEMATECH Surface Preparation and Cleaning Conference >Effect of Composition of Post Etch Residues (PER) on Their Removal in Choline Chloride-Malonic Acid Deep Eutectic Solvent (DES) System (PPT)
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Effect of Composition of Post Etch Residues (PER) on Their Removal in Choline Chloride-Malonic Acid Deep Eutectic Solvent (DES) System (PPT)

机译:蚀刻后残留物(PER)的组成对胆碱 - 丙酸盐深共晶溶剂(DES)系统(PPT)中的去除

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摘要

BEOL CLEANING FORMULATIONS BASED ON CHOLINE CHLORIDE/MALONIC ACID DEEP EUTECTIC SOLVENT SYSTEMS ARE ENVIRONMENTALLY FRIENDLY ALTERNATIVES FOR TRADITIONAL CLEANING FORMULATIONS 1. CC/MA BES removes inorganic and mixtures of organic and inorganic PER 2. HAc/CC/MA DES is a promising cleaning formulation to remove PER and PR.
机译:基于胆碱/丙酸盐深凝胶系统的BEOL清洗配方是传统清洗配方的环保替代品1. CC / MA BES除去每2. HAC / CC / MAS的有机和无机混合物是一种有前途的清洁配方每次和公关删除。

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