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Nanoscale Heat Transport through Epitaxial Ultrathin Hetero Films: Bi(111)/Si(001) and Bi(111)/Si(111)

机译:纳米级热传输通过外延超薄杂膜:Bi(111)/ Si(001)和Bi(111)/ Si(111)

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The cooling process of ultrathin hetero films upon excitation with short laser pulses was studied for epitaxial Bi(111) films on Si(001) and Si(111) substrates by means of the Debye-Waller effect with ultrafast electron diffraction. From the exponential decay of the temperature, a cooling time constant was determined as a function of thickness for both substrates. For Bi/Si(111), a linear dependence between the decay constant and thickness was observed, even for 2.8 nm thin films, as predicted from the diffuse mismatch model (DMM) and the acoustic mismatch model (AMM). However, with Bi/Si(001), a significant deviation from this linear dependence was observed for film thicknesses below 5 nm.
机译:通过用超壁效应,研究了在Si(001)和Si(111)基板上的外延Bi(111)膜激发后的超薄杂膜的冷却过程通过与超快电子衍射的德细效果进行了外延Bi(111)薄膜。从温度的指数衰减,将冷却时间常数确定为两个基板的厚度的函数。对于Bi / Si(111),观察到衰减常数和厚度之间的线性依赖性,即使是从漫反射模型(DMM)和声学不匹配模型(AMM)预测的2.8nm薄膜。然而,对于Bi / Si(001),对于低于5nm的膜厚度,观察到与该线性依赖性的显着偏差。

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