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Study of Five Substrate Pad Finishes for the Co-design of Solder Joint Reliability under Board-level Drop and Temperature Cycling Test Conditions

机译:用于在板级下降和温度循环试验条件下焊接接头可靠性共定设计五个基板垫的研究

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The current paper evaluates the impact on solder joint reliability (SJR), using board-level drop test, temperature cycling on board (TCoB) test, and component-level high-speed solder ball shear (HSSBS) test, of five existing and under-development substrate pad finishes including Electrolytic Nickel-Gold (NiAu), Organic Solderability Preservative (OSP), stencil printed Solder-on-Pad (SoP), Immersion Tin (ImSn) and Electroless Nickel-Electroless Palladium-Immersion Gold (NiPdAu). The board-level drop test was performed following standard JEDEC conditions with 1500G/0.5ms. The TCoB test was performed following IPC-9701 with -40°C~125°C and 15 minutes dwell/ramp. The HSSBS test was performed using Dage 4000-HS machine with 500mm/s shearing speed and 30μm shearing height. It is seen from drop test results that NiAu leg gives the poorest SJR. All of the other four pad finishes give very satisfactory drop test durability. In TCoB test results, however, it is observed that NiAu gives the best SJR. OSP gives very poor SJR as compared with the other four counterparts whose 2-parameter Weibull characteristic lives exceed 2000 temperature cycles with significant margin. Subsequent process improvements were made in an effort to improve the SJR of OSP in TCoB test. However, even with these improvements the characteristic lives of two improved OSP testing legs only marginally pass the SJR requirement of TCoB. HSSBS test was also performed to understand the resistance to brittle intermetallic compound (IMC) failure of the five finishes under time zero and ageing condition. It is observed that although SoP sees very good SJR in both drop and TCoB tests, it shows bad resistance to brittle IMC failure in HSSBS test. Encouragingly, NiPdAu, which shows good SJR in both drop and TCoB tests, is also found to give excellent resistance to brittle IMC failure in HSSBS test even after ageing at 125°C for 1000 hours.
机译:目前的纸张评估了使用板级下降试验,电路板(TCOB)试验的温度循环试验的影响,以及五个现有的和下方的组件级高速焊球剪切(HSSBS)试验的焊接接头可靠性(SJR)的影响。 - 开发基板垫饰面包括电解镍 - 金(NIAU),有机可焊性防腐剂(OSP),模板印刷焊盘(SOP),浸入式锡(IMSN)和无电镀镍钯 - 浸渍金(NIPDAU)。在标准JEDEC条件下进行液板级滴测试,1500g / 0.5ms。在具有-40°C〜125°C和15分钟停留/斜坡的IPC-9701之后进行TCOB测试。使用具有500mm / s剪切速度和30μm剪切高度的DAGE 4000-HS机进行HSSBS测试。从下降测试结果看,尼亚腿给出了最糟糕的SJR。所有其他四个垫片饰面都具有非常令人满意的降低测试耐用性。然而,在TCOB测试结果中,观察到NIAU给出了最好的SJR。与其他四个对应物相比,OSP提供了非常糟糕的SJR,其2个参数Weibull特性生活超过2000个温度周期,具有显着的边距。随后的流程改进是为了提高OSP在TCOB测试中的SJR。然而,即使有了这些改善,两个改进的OSP测试腿的特征生活仅限于略微通过TCOB的SJR要求。还进行了HSSBS测试以了解在零和老化条件下五种饰面的抗脆性金属间化合物(IMC)的抵抗力。观察到,虽然SOP在两种下降和TCOB测试中看到了非常好的SJR,但它显示出HSSBS测试中的脆性IMC失败的抗性不良。令人鼓舞的是,奈迪在两次下降和TCOB试验中显示出良好的SJR,也发现即使在125℃下老化1000小时后,均匀的HSSBS测试中的脆性IMC衰竭也能出色抗性。

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