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Implementation of an efficient defect classification method in photomask mass production

机译:光掩模批量生产中有效缺陷分类方法的实现

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In photomask production environments, increasing productivity of defect inspection and improving fidelity of defect classification are important for mask makers to improve capacity of defect inspection tools and to enhance quality of production. In particular, defect classification time corresponds directly to the cost and the cycle time of mask manufacturing and new product development. KLA-Tencor has introduced an automatic defect grouping tool "ReviewSmart" which automatically bins defects with high fidelity. ReviewSmart has been reported in engineering R&D and evaluation [1], [2] In this paper, we focus on implementation of ReviewSmart in photomask production. 592 plates were processed during the evaluation period Those plates are for products of logic, memory and flash Technology nodes are from 65nm to 180nm. With optimized production setting, the automatic defect grouping tool -ReviewSmart improves productivity of defect inspection by 7% with 100% fidelity. In addition to improve productivity, ReviewSmart is helpful to classify aggressive OPC caused nuisance, troubleshoot process issues and expedite product development and improve usable inspection sensitivity as well.
机译:在光掩模生产环境中,缺陷检查的生产率提高,提高缺陷分类的保真度对于面具制造商来说是重要的,以提高缺陷检查工具的能力并提高生产质量。特别地,缺陷分类时间直接对应于掩模制造和新产品开发的成本和循环时间。 KLA-Tencor推出了自动缺陷分组工具“评论地图”,其自动使用高保真度缺陷。评论在工程研发和评估中报道了[1],[2]在本文中,我们专注于在光掩模生产中的评论场的实施。在评估期间加工592个板,那些板是逻辑产品,内存和闪存技术节点为65nm至180nm。通过优化的生产设置,自动缺陷分组工具-Reviewsmart通过100%保真度提高了7%的缺陷检查的生产率。除了提高生产力外,评论地图有助于分类攻击性OPC造成的滋扰,排除过程问题和加快产品开发,并提高了可用的检测灵敏度。

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