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Understanding the Impact of Accelerated Temperature Profiles on Lead-Free Soldering

机译:了解加速温度曲线对无铅焊接的影响

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Traditional reflow profiles for lead-free soldering typically require longer processing times due to elevated peak temperatures and flux activation times defined by solder paste suppliers. These profiles become particularly challenging when a wide variety of packaging types are integrated within a single circuit design. Further difficulty is presented when product designs with high thermal mass, such as heat slugs and metal substrates, are processed. These designs create large thermal gradients throughout a circuit assembly and add further complexity to finding an "optimal" profile window. All of these issues create a significant increase in reflow processing times for lead-free soldering. This paper investigates these increased processing times required for high volume manufacturing of lead-free electronics. A study of typical process capacity and real throughput capacity is presented. The study evaluates high volume electronics manufacturing ranging from small circuit assemblies (e.g. cell phone) to large circuit assemblies (e.g. automotive and computers) and investigates a series of "best" reflow profiles to accelerate the standard lead-free process window to meet a targeted manufacturing capacity using an automated profiling system. A test vehicle is then fabricated using this defined process window and tested for quality (solder voiding and appearance) and solder joint reliability (accelerated life testing). The designed test vehicle includes components from a large physical distribution including: small and large BGAs, QFNs, and any type discrete components. During assembly, virtual profiling is used to document any deviations to the process profile window. The quality and reliability data are presented within this publication and failure analysis is included to determine the capability of this proposed profile. When employed, this profiling strategy allows many manufacturers to reduce the processing time for reflowing lead-free circuit assemblies without significant lost in manufacturing quality or reliability. Furthermore, this study provides a sound understanding and limitations for using accelerated profiling speeds for lead-free soldering applications.
机译:由于由焊膏供应商定义的峰值温度和通量激活时间,传统的回流型材通常需要更长的加工时间。当各种包装类型集成在单电路设计中时,这些曲线变得尤其挑战。当加工具有高热质量的产品设计,例如热块和金属基板的产品设计时,提出了进一步的困难。这些设计在整个电路组件中产生大的热梯度,并添加进一步的复杂性以查找“最佳”剖面窗口。所有这些问题都会产生显着增加的无铅焊接的回流处理时间。本文研究了铅制造无铅电子产品所需的增加的加工时间。提出了典型过程能力和实际吞吐量的研究。该研究评估了从小型电路组件(例如,手机)到大型电路组件(例如汽车和计算机)的大量电子制造,并研究了一系列“最佳”回流型材以加速标准无铅处理窗口以满足目标使用自动分析系统的制造能力。然后使用该定义的工艺窗口制造测试车辆,并测试质量(焊剂空隙和外观)和焊点可靠性(加速寿命测试)。设计的测试车辆包括来自大型物理分布的部件,包括:小型和大BGA,QFN和任何类型的离散组件。在组装期间,虚拟分析用于记录进程配置文件窗口的任何偏差。在本出版物中介绍了质量和可靠性数据,包括故障分析以确定该提出的概况的能力。当采用时,这种分析策略允许许多制造商减少了在制造质量或可靠性中没有显着损失的无铅电路组件的处理时间。此外,本研究提供了对无铅焊接应用的加速分析速度提供了声音理解和限制。

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