Effects of SrAl_2O_4 Homo-Buffer Layer on SrAl_2O_4:Eu Phosphors Film Grown on Glass by RF Sputtering

摘要

The influence of pre-deposition of homo-buffer layers on film quality is studied for SrAl_2O_4:Eu~(2+) (SAO) crystalline film prepared by RF magnetron method. This preparation technique is necessary to prepare high quality films suitable for the development of SAO devices. Crystallinity and surface morphology were characterized by X-ray diffraction and scanning electron microscopy. After introducing a homo-buffer layer, not only the crystalline but also the surface morphology and adhesion of the film were obviously improved. These results imply that the buffer layer relaxes the strain due to the lattice mismatch between SAO and quartz glass, which improved the crystalline and adhesion of the film.