首页> 外文会议>IEEE Lester Eastman Conference on High Performance Devices >Design of GaN/AlGaN HEMT class-E power amplifier considering trapping and thermal effects
【24h】

Design of GaN/AlGaN HEMT class-E power amplifier considering trapping and thermal effects

机译:考虑诱捕和热效应的GaN / Algan HEMT Class-E功放设计

获取原文

摘要

A microwave class-E power amplifier using AlGaN/GaN HEMI' as the switching device is reported by incorporating trapping and thermal effects in the large-signal device model. The load network of the class-E amplifier is designed by considering more realistic exponential decay of the drain current during fall time and finite quality factor of the resonant circuit to incorporate the nonidealities of the active device and passive components. With 9V supply voltage, calculated output power and power conversion efficiency are 89mW and 58% at 1GHz which decrease to 84mW and 54% at 3.8GHz, respectively for a GaN/Al{sub}0.30Ga{sub}0.70N HEMT with gate width of 50μm.
机译:通过在大信号装置模型中结合捕获和热效应,报道了使用AlGaN / GaN Hemi的微波C类-E功率放大器。通过考虑下降时间期间的漏极电流的更现实的指数衰减和谐振电路的有限质量因子来结合有源器件和无源元件的非前沿设计,通过考虑更现实的指数衰减来设计Class-E放大器的负载网络。具有9V电源电压,计算出的输出功率和功率转换效率为89mW,1GHz为58%,分别为GaN / Al {Sub} 0.030ga {sub} 0.70n宽度为84mW和3.8ghz的54%。 50μm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号